Electrical Characterization Of Lead-Free (1-X)(Ba0.90Sr0.10)(Zr0.20Ti0.80)O3-Xnanbo3 Relaxor Ceramics For Capacitor Application

Abstract

In the present work, (1-x)(Ba_0.90Sr_0.10)(Zr_0.20Ti_0.80)O₃-xNaNbO₃ (x = 0.00, 0.05, 0.10. 0.15, 0.20) based relaxor ceramics were prepared through solid-state reaction route. Morphological and electrical characterizations were performed. Polygonal-type grains were observed. 10% NN-based composition exhibited the highest average grain size value (~740.96 nm). EDX analysis ensured the presence of Ba, Sr, Zr, Ti, Na, and Nb within the compositions. 10% NN-based composition showed a better Q-factor curve compared to others. It also showed the highest resistivity value. All of the compositions showed a strong relationship between the electrical properties with frequency and ensured their application in energy storage-based electronic devices.