JIMIL H. JOSHI. A Framework for Semiconductor Faults Detection and Classification in Wafer Fabrication Processes: Improving Yield and Quality Control . International Journal of Progressive Research in Science and Engineering , [S. l.], v. 4, n. 4, p. 32–35, 2023. Disponível em: https://journal.ijprse.com/index.php/ijprse/article/view/809. Acesso em: 21 may. 2024.